EBM-TEG Power Supply
EBM-TEG Power Supply
Product Overview
Technical Specifications
Product Advantages
Product Applications
Product Overview
The EBM30N/TEG is an integrated high-voltage power solution designed specifically for Thermionic Emission Scanning Electron Microscopes (SEM).
It provides multiple low-noise and ultra-stable outputs including Accelerator, Filament, Bias, PMT, Scintillator, and Collector supplies.
Spellman’s proprietary packaging technology ensures smaller size, lower noise, and higher performance compared with conventional SEM power supplies.
Differential analog programming and comprehensive protection mechanisms guarantee safe and reliable SEM operation.
Technical Specifications
| Item | Specification |
| Input Power | +24VDC ±5%, max 2.5A |
| Accelerator Voltage | 0 to −30kV, 170µA; ultra-stable, low ripple |
| Bias Cancellation | 0 to +3.5kV, 150µA; referenced to Accelerator |
| Filament Supply | −1.936 to +1.936V, max 3.87A; filament failure monitoring |
| PMT High Voltage | 0 to −1300V, max 250µA |
| Scintillator High Voltage | +8kV to +11kV, max 1mA |
| Collector Supply | 30V to 500V, max 5mA |
| Connectors | Claymount CA11 Mini 75 (Accelerator); BNC.HT (PMT/Collector); Spellman custom (Scintillator); JST (I/O) |
| Operating Temperature | 0°C to +45°C |
| Storage Temperature | −20°C to +75°C |
| Humidity | 0–85% RH, non-condensing |
| Dimensions | 105 × 250 × 190 mm |
| Weight | 7.5kg |
| Certifications | UL, CE, UKCA, RoHS; IEC/UL 61010-1 compliant |
Product Advantages
• Dedicated design for Thermionic SEM triode systems
• Extremely high precision, low noise and high stability
• Multi-output integrated module reduces system size and cost
• Full protection: over-voltage, over-current, arc & short-circuit
• Differential programming for excellent noise immunity
• Worldwide certifications for easy integration
• customization available
Product Applications
• Thermionic Scanning Electron Microscopes (SEM)
• Replacement / upgrade power module for SEM systems
• Scientific and educational electron microscopy
• Electron-beam imaging equipment
• PMT & scintillator detector power supply
• High-precision electron-optical instruments
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