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EBM-TEG Power Supply

EBM-TEG Power Supply

The EBM30N/TEG is an integrated high-voltage power solution designed specifically for Thermionic Emission Scanning Electron Microscopes (SEM). It provides multiple low-noise and ultra-stable outputs including Accelerator, Filament, Bias, PMT, Scintillator, and Collector supplies. Spellman’s proprietary packaging technology ensures smaller size, lower noise, and higher performance compared with conventional SEM power supplies. Differential analog programming and comprehensive protection mechanisms guarantee safe and reliable SEM operation.
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Product Overview

Technical Specifications

Product Advantages

Product Applications

Product Overview

The EBM30N/TEG is an integrated high-voltage power solution designed specifically for Thermionic Emission Scanning Electron Microscopes (SEM).
It provides multiple low-noise and ultra-stable outputs including Accelerator, Filament, Bias, PMT, Scintillator, and Collector supplies.

 

Spellman’s proprietary packaging technology ensures smaller size, lower noise, and higher performance compared with conventional SEM power supplies.

 

Differential analog programming and comprehensive protection mechanisms guarantee safe and reliable SEM operation.

Technical Specifications

Item Specification
Input Power +24VDC ±5%, max 2.5A
Accelerator Voltage 0 to −30kV, 170µA; ultra-stable, low ripple
Bias Cancellation 0 to +3.5kV, 150µA; referenced to Accelerator
Filament Supply −1.936 to +1.936V, max 3.87A; filament failure monitoring
PMT High Voltage 0 to −1300V, max 250µA
Scintillator High Voltage +8kV to +11kV, max 1mA
Collector Supply 30V to 500V, max 5mA
Connectors Claymount CA11 Mini 75 (Accelerator); BNC.HT (PMT/Collector); Spellman custom (Scintillator); JST (I/O)
Operating Temperature 0°C to +45°C
Storage Temperature −20°C to +75°C
Humidity 0–85% RH, non-condensing
Dimensions 105 × 250 × 190 mm
Weight 7.5kg
Certifications UL, CE, UKCA, RoHS; IEC/UL 61010-1 compliant

Product Advantages

•    Dedicated design for Thermionic SEM triode systems
•    Extremely high precision, low noise and high stability
•    Multi-output integrated module reduces system size and cost
•    Full protection: over-voltage, over-current, arc & short-circuit
•    Differential programming for excellent noise immunity
•    Worldwide certifications for easy integration
•     customization available

Product Applications

•    Thermionic Scanning Electron Microscopes (SEM)
•    Replacement / upgrade power module for SEM systems
•    Scientific and educational electron microscopy
•    Electron-beam imaging equipment
•    PMT & scintillator detector power supply
•    High-precision electron-optical instruments

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