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Ultra-depth 3D Digital Microscope

Ultra-depth 3D Digital Microscope

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Product Overview

Technical Specifications

Product Advantages

Product Applications

Product Overview

The SHINING SCIENTIFIC DMS Series 3D Digital Microscope is an advanced ultra-depth-of-field imaging and measurement system designed for high-precision industrial inspection, semiconductor analysis, materials research, and scientific imaging applications.

Integrating high-resolution optical imaging, intelligent autofocus, 3D measurement, real-time depth fusion, and automated image analysis, the DMS Series provides a complete all-in-one digital microscopy solution for modern laboratories and industrial environments.

The system supports ultra-wide magnification ranges, intelligent motorized control, high-speed image stitching, and advanced AI-assisted measurement technologies, enabling users to achieve fast, accurate, and repeatable microscopic analysis with exceptional clarity and efficiency.

Technical Specifications

ItemDMS Series
Product Type3D Digital Microscope
Magnification Range20X – 7500X
Camera12MP High-Resolution Camera
ResolutionUp to 4000 × 3000
Display28-inch 4K UHD Display
Optical SystemTelecentric Continuous Zoom
Observation ModesBrightfield / Darkfield / Polarized / DIC
IlluminationRing / Coaxial / Transmitted / Hybrid
Stage TypeMotorized XY Stage
Stage TravelUp to 330 × 330 mm
Tilt Angle±90°
Image Stitching2D & 3D
Measurement Functions2D / 3D / Contour / Area / Volume
Image ProcessingHDR / Focus Stacking / Glare Removal
Data ExportWord / Excel / CSV
Computer SystemIntel i7 / 64GB RAM / SSD + HDD
Power Supply100–240V AC 50/60Hz

Product Advantages

1. Ultra-Depth 3D Imaging Technology

Advanced real-time depth fusion technology generates fully focused high-resolution images, even on uneven sample surfaces, delivering exceptional 3D visualization and analysis capability.

2. Intelligent Motorized Control System

Integrated motorized XY stage, autofocus system, and electric objective switching allow intuitive and efficient operation through the dedicated controller.

3. Wide Magnification Range

Supports rapid one-touch magnification switching from 20X up to 7500X, meeting diverse observation and measurement requirements.

4. High-Precision Measurement & Analysis

Provides comprehensive 2D and 3D measurement tools including contour measurement, particle analysis, area calculation, height measurement, and automated edge recognition.

5. Advanced Optical System

Equipped with professional telecentric APO objective lenses for ultra-high-resolution imaging with minimal distortion and exceptional detail reproduction.

6. Powerful Image Processing

Features HDR imaging, anti-reflection processing, real-time focus stacking, glare removal, and large-area image stitching for superior image quality.

Product Applications

Semiconductor Inspection

High-precision imaging and measurement for IC packaging, PCB inspection, solder analysis, and semiconductor defect detection.

Materials Science

Suitable for surface morphology analysis, metallography, roughness measurement, and advanced material characterization.

Industrial Quality Control

Used for precision component inspection, dimensional analysis, and failure analysis in manufacturing environments.

Biological & Scientific Research

Applicable for biological samples, insects, algae, fibers, and scientific imaging applications.

Forensic & Document Analysis

Supports handwriting indentation analysis, surface trace detection, and forensic imaging applications.

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