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Frequently Asked Questions
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Secondary Electrons (SE)
Generated from the top 5–10 nm of the sample with energies of 0–50 eV. Features:
Highly sensitive to surface topography;
High resolution, typically 5–10 nm;
Signal intensity mainly depends on surface geometry rather than atomic number.
Backscattered Electrons (BSE)
Emerge from deeper regions (50 nm–300nm) after large-angle scattering. Features:
Yield increases with atomic number, allowing Z-contrast imaging;
Higher energy, capable of revealing deeper structural information;
Lower resolution than SE, depending on accelerating voltage and atomic number.
SEM magnification includes screen magnification and print magnification:
Screen Magnification:
Magnification = Display size / Scan width (M = D / d).
Print Magnification:
Defined by the photographic print size and independent of monitor size.
Samples must be solid and meet basic safety conditions: non-toxic, non-radioactive, non-contaminating, non-magnetic, dry, and chemically stable. Non-conductive or poorly conductive samples should either be imaged using suitable modes and conditions, or coated with a conductive metal.
SEM provides high resolution and a wide, continuously adjustable magnification range—from a few times to several hundred thousand times. It offers large depth of field, a wide field of view, and strong three-dimensional contrast, making it ideal for observing fine surface structures on uneven samples. Sample preparation is relatively simple, which is why SEM is one of the most widely used tools for microstructural analysis.
Shining Scientific Technology(China) Co.,Ltd.
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