Argon Ion Polishing 685 (PECS II)
Argon Ion Polishing 685 (PECS II)
Product Overview
Technical Specifications
Product Advantages
Product Applications
Product Overview
The PECSTM (precision etching coating system) II is a table top broad beam argon milling tool for polishing as well as coating samples. These two processes can be performed on the same sample without interruption of the vacuum.
The PECS II is a completely self-contained, bench-top instrument designed to polish surfaces and remove damage using two broad argon beams. This method is ideal for producing high- quality samples for scanning electron microscope (SEM), optical or scanning probe microscopy (SPM). These specimens are suitable for imaging, energy dispersive x-ray spectroscopy (EDS), electron backscatter diffraction (EBSD), cathodoluminescence (CL), electron-beam induced current (EBIC), or other analytical techniques.
The PECS II platform utilizes WhisperLok® technology with an optional temperature-controlled liquid nitrogen cooling stage. This feature helps prevent sample melting or structural changes caused by heat associated with conventional milling processes.
The PECS II platform incorporates a 10-inch touch screen to increase control and reproducibility of the polishing process
for both novice and expert users. The digital zoom microscope monitors the polishing process in real-time and stores color images in the DigitalMicrograph® software for review and analysis while your sample is in the SEM.
Technical Specifications
| Item | Technical Specification |
| Ion Source | |
| Ion guns | Two Penning ion guns with rare-earth magnets |
| Milling angle (°) | 0 – 18°, each gun independently adjustable |
| Ion beam energy (keV) | 0.1 – 8.0 |
| Peak ion current density (mA/cm²) | 10 |
| Milling rate on silicon (µm/h) | 90 |
| Beam diameter | Adjustable via gas flow controller or discharge voltage |
| Beam modulation | Single or double modulation, adjustable |
| Specimen Stage | |
| Sample size (D × H, mm) | 32 × 15 |
| Rotation (rpm) | 1 – 6 |
| Viewing | Digital zoom microscope with PC and DigitalMicrograph storage (optional) |
| Vacuum System | |
| Dry pumping system | Two-stage diaphragm pump backing an 80 L/s turbo drag pump |
| Pressure (torr) | Base: 5 × 10⁻⁶Operating: 8 × 10⁻⁵ |
| Vacuum gauge | Cold cathode (main chamber); solid-state (backing pump) |
| Specimen airlock | WhisperLok technology |
| Specimen exchange time | < 1 min |
| User Interface | 10-inch color touchscreen with full parameter control and recipe operation |
| Dimensions & Utilities | |
| Overall size (mm) | 575 × 495 × 615 |
| Shipping weight (kg) | 45 |
| Power consumption (W) | 200 during operation; 100 with guns off |
| Power requirements | Universal 100 – 240 VAC, 50 – 60 Hz |
| Argon gas (psi) | 25 |
Product Advantages
• Fully automated argon ion polishing system suitable for preparation of SEM samples to prepare damage free surfaces, cross sections and deposit coatings to protect or eliminate charging.
• Polish, etch or coat samples with a single pump down
• Etch at voltages as low as 100 V for rapid and damage free preparation of sample surfaces
• Permit samples as large as 32 mm in diameter
• Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air (optional)
• Store and analyze image in DigitalMicrograph® software from Gatan for digital optical imaging
• Display and control all PECS II parameters using integrated 10-inch color touch screen
Product Applications
• Microstructure refinement of zinc-lithium alloys for improved biomedical properties
• Surface preservation during Cu coating of porous Zn alloys
• Oxide removal from magnesium alloys for successful EBSD mapping
• Improved EDS analysis by controlling surface and thickness conditions
• Surface optimization of multiphase Al alloys for EBSD
• Interphase analysis in complex CoRe alloy structures
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